An XRF analyzer for measurement of coating thickness and material composition.

 

    * Measure the thickness and/or composition of plating, coatings, and films, containing elements from Ti through U

    * 5 layers / 15 elements / Common elements correction

    * Composition analysis of up to 15 elements simultaneously

    * Measurement method according to ISO 3497, ASTM B568 and DIN 50987

 

Additional Key Features

 

    * Fast and accurate

    * Superior performance - highest degree of confidence in results and maximum throughput.

    * Distance independent mode for measurement in recesses or odd shaped samples with one calibration.

    * Easy operation

    * Automatic spectrum calibration

    * Small spot size

    * Largest measurabale sample area

    * Distance independent measurement (option)

    * Auto range finder laser focus (option)

    * Advanced data export (option)

    * Integrated PC and monitor

    * Add unlimited number of applications in the future at no additional cost